Sagar S. Sabade, D. M. H. Walker. Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 381-389, IEEE Computer Society, 2002. [doi]
@inproceedings{SabadeW02,
title = {Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis},
author = {Sagar S. Sabade and D. M. H. Walker},
year = {2002},
url = {http://www.computer.org/proceedings/dft/1831/18310381abs.htm},
tags = {analysis, data-flow analysis},
researchr = {https://researchr.org/publication/SabadeW02},
cites = {0},
citedby = {0},
pages = {381-389},
booktitle = {17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1831-1},
}