Sagar S. Sabade, D. M. H. Walker. Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 381-389, IEEE Computer Society, 2002. [doi]
Abstract is missing.