Sagar S. Sabade, D. M. H. Walker. Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 361, IEEE Computer Society, 2003. [doi]
@inproceedings{SabadeW03:1, title = {Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification}, author = {Sagar S. Sabade and D. M. H. Walker}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/vlsid/2003/1868/00/18680361abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/SabadeW03%3A1}, cites = {0}, citedby = {0}, pages = {361}, booktitle = {16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-1868-0}, }