Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification

Sagar S. Sabade, D. M. H. Walker. Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 361, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.