I::DDQ:: and Voltage Testable CMOS Flip-flop Configurations - researchr publication

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Manoj Sachdev. I::DDQ:: and Voltage Testable CMOS Flip-flop Configurations. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 534-543, IEEE Computer Society, 1995.

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