Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Manoj Sachdev, Peter Janssen, Victor Zieren. Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 204, IEEE Computer Society, 1998. [doi]

This author has not been identified. Look up 'Manoj Sachdev' in GoogleThis author has not been identified. Look up 'Peter Janssen' in GoogleThis author has not been identified. Look up 'Victor Zieren' in Google

runs on WebDSL