Manoj Sachdev, Peter Janssen, Victor Zieren. Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 204, IEEE Computer Society, 1998. [doi]
@inproceedings{SachdevJZ98,
title = {Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs},
author = {Manoj Sachdev and Peter Janssen and Victor Zieren},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930204abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/SachdevJZ98},
cites = {0},
citedby = {0},
pages = {204},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}