Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan. Test Generation Approach for Post-Silicon Validation of High End Microprocessor. In 15th Euromicro Conference on Digital System Design, DSD 2012, Cesme, Izmir, Turkey, September 5-8, 2012. pages 830-836, IEEE, 2012. [doi]
@inproceedings{SadasivamAM12,
title = {Test Generation Approach for Post-Silicon Validation of High End Microprocessor},
author = {Satish Kumar Sadasivam and Sangram Alapati and Varun Mallikarjunan},
year = {2012},
doi = {10.1109/DSD.2012.148},
url = {http://dx.doi.org/10.1109/DSD.2012.148},
researchr = {https://researchr.org/publication/SadasivamAM12},
cites = {0},
citedby = {0},
pages = {830-836},
booktitle = {15th Euromicro Conference on Digital System Design, DSD 2012, Cesme, Izmir, Turkey, September 5-8, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2498-4},
}