Satish Kumar Sadasivam, Sangram Alapati, Varun Mallikarjunan. Test Generation Approach for Post-Silicon Validation of High End Microprocessor. In 15th Euromicro Conference on Digital System Design, DSD 2012, Cesme, Izmir, Turkey, September 5-8, 2012. pages 830-836, IEEE, 2012. [doi]
Abstract is missing.