Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs

Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(4):885-894, 2020. [doi]

Abstract

Abstract is missing.