Expedited response compaction for scan power reduction

Samah Mohamed Saeed, Ozgur Sinanoglu. Expedited response compaction for scan power reduction. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 40-45, IEEE Computer Society, 2011. [doi]

Authors

Samah Mohamed Saeed

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Ozgur Sinanoglu

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