Samah Mohamed Saeed, Ozgur Sinanoglu. Expedited response compaction for scan power reduction. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 40-45, IEEE Computer Society, 2011. [doi]
@inproceedings{SaeedS11-0,
title = {Expedited response compaction for scan power reduction},
author = {Samah Mohamed Saeed and Ozgur Sinanoglu},
year = {2011},
doi = {10.1109/VTS.2011.5783752},
url = {http://dx.doi.org/10.1109/VTS.2011.5783752},
researchr = {https://researchr.org/publication/SaeedS11-0},
cites = {0},
citedby = {0},
pages = {40-45},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}