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A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series

Kurt Saetzler, P. McCanny, E. Patricia Rodriguez, Heinz Horstmann, R. M. Bruno, W. Denk. A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series. In Ken Dawson-Howe, Rozenn Dahyot, Anil C. Kokaram, Gerard Lacey, editors, 13th International Machine Vision and Image Processing Conference, IMVIP '09, Dublin, Ireland, September 2-4, 2009. pages 162-167, IEEE Computer Society, 2009. [doi]

Authors

Kurt Saetzler

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P. McCanny

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E. Patricia Rodriguez

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Heinz Horstmann

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R. M. Bruno

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W. Denk

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