Kurt Saetzler, P. McCanny, E. Patricia Rodriguez, Heinz Horstmann, R. M. Bruno, W. Denk. A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series. In Ken Dawson-Howe, Rozenn Dahyot, Anil C. Kokaram, Gerard Lacey, editors, 13th International Machine Vision and Image Processing Conference, IMVIP '09, Dublin, Ireland, September 2-4, 2009. pages 162-167, IEEE Computer Society, 2009. [doi]
Abstract is missing.