A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series

Kurt Saetzler, P. McCanny, E. Patricia Rodriguez, Heinz Horstmann, R. M. Bruno, W. Denk. A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series. In Ken Dawson-Howe, Rozenn Dahyot, Anil C. Kokaram, Gerard Lacey, editors, 13th International Machine Vision and Image Processing Conference, IMVIP '09, Dublin, Ireland, September 2-4, 2009. pages 162-167, IEEE Computer Society, 2009. [doi]

@inproceedings{SaetzlerMRHBD09,
  title = {A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series},
  author = {Kurt Saetzler and P. McCanny and E. Patricia Rodriguez and Heinz Horstmann and R. M. Bruno and W. Denk},
  year = {2009},
  doi = {10.1109/IMVIP.2009.36},
  url = {http://doi.ieeecomputersociety.org/10.1109/IMVIP.2009.36},
  researchr = {https://researchr.org/publication/SaetzlerMRHBD09},
  cites = {0},
  citedby = {0},
  pages = {162-167},
  booktitle = {13th International Machine Vision and Image Processing Conference, IMVIP '09, Dublin, Ireland, September 2-4, 2009},
  editor = {Ken Dawson-Howe and Rozenn Dahyot and Anil C. Kokaram and Gerard Lacey},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-3796-2},
}