TIDE-S: Telemetry Informed Delay Testing With Optimized Sensor Placement

Deepesh Sahoo, Eduardo Ortega, Peter Domanski, Farshad Firouzi, Krishnendu Chakrabarty. TIDE-S: Telemetry Informed Delay Testing With Optimized Sensor Placement. IEEE Trans. VLSI Syst., 34(4):1369-1382, April 2026. [doi]

Abstract

Abstract is missing.