Reliability assessment of backward error recovery for SRAM-based FPGAs - researchr publication authors

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Fouad Sahraoui, Ghaffari Fakhreddine, Mohamed El Amine Benkhelifa, Bertrand Granado. Reliability assessment of backward error recovery for SRAM-based FPGAs. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 248-252, IEEE, 2014. [doi]

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