Fouad Sahraoui, Ghaffari Fakhreddine, Mohamed El Amine Benkhelifa, Bertrand Granado. Reliability assessment of backward error recovery for SRAM-based FPGAs. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 248-252, IEEE, 2014. [doi]
@inproceedings{SahraouiFBG14,
title = {Reliability assessment of backward error recovery for SRAM-based FPGAs},
author = {Fouad Sahraoui and Ghaffari Fakhreddine and Mohamed El Amine Benkhelifa and Bertrand Granado},
year = {2014},
doi = {10.1109/IDT.2014.7038622},
url = {http://doi.ieeecomputersociety.org/10.1109/IDT.2014.7038622},
researchr = {https://researchr.org/publication/SahraouiFBG14},
cites = {0},
citedby = {0},
pages = {248-252},
booktitle = {9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014},
publisher = {IEEE},
isbn = {978-1-4799-8200-4},
}