R. A. Said. Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing. II. Applications, capabilities, and limitations. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 657-660, IEEE, 2000. [doi]
No references recorded for this publication.
No citations of this publication recorded.