Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements - researchr publication

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F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot. Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectronics Reliability, 42(3):459-461, 2002. [doi]

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