Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

B. Saillet, Jean Michel Portal, Didier Née. Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 131-139, IEEE Computer Society, 2005. [doi]

This author has not been identified. Look up 'B. Saillet' in GoogleThis author has not been identified. Look up 'Jean Michel Portal' in GoogleThis author has not been identified. Look up 'Didier Née' in Google

runs on WebDSL