B. Saillet, Jean Michel Portal, Didier Née. Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 131-139, IEEE Computer Society, 2005. [doi]
@inproceedings{SailletPN05,
title = {Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring},
author = {B. Saillet and Jean Michel Portal and Didier Née},
year = {2005},
doi = {10.1109/DFTVS.2005.36},
url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.36},
tags = {process monitoring, testing, data-flow},
researchr = {https://researchr.org/publication/SailletPN05},
cites = {0},
citedby = {0},
pages = {131-139},
booktitle = {20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2464-8},
}