B. Saillet, Jean Michel Portal, Didier Née. Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 131-139, IEEE Computer Society, 2005. [doi]
Abstract is missing.