Ahmed S. Sajit, Michael A. Turi. SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells. In IEEE 7th Annual Computing and Communication Workshop and Conference, CCWC 2017, Las Vegas, NV, USA, January 9-11, 2017. pages 1-5, IEEE, 2017. [doi]
Abstract is missing.