Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Kiyohiko Sakakibara, Toshio Kumamoto, K. Arimoto. Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]

This author has not been identified. Look up 'Kiyohiko Sakakibara' in GoogleThis author has not been identified. Look up 'Toshio Kumamoto' in GoogleThis author has not been identified. Look up 'K. Arimoto' in Google

runs on WebDSL