Kiyohiko Sakakibara, Toshio Kumamoto, K. Arimoto. Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.