5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance - researchr publication authors

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Yorito Sakano, Takahiro Toyoshima, Ryosuke Nakamura, Tomohiko Asatsuma, Yuki Hattori, Takayuki Yamanaka, Ryoichi Yoshikawa, Naoki Kawazu, Tomohiro Matsuura, Takahiro Iinuma, Takahiro Toya, Tomohiko Watanabe, Atsushi Suzuki, Yuichi Motohashi, Junichiro Azami, Yasushi Tateshita, Tsutomu Haruta. 5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance. In 2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020. pages 106-108, IEEE, 2020. [doi]

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