Yorito Sakano, Takahiro Toyoshima, Ryosuke Nakamura, Tomohiko Asatsuma, Yuki Hattori, Takayuki Yamanaka, Ryoichi Yoshikawa, Naoki Kawazu, Tomohiro Matsuura, Takahiro Iinuma, Takahiro Toya, Tomohiko Watanabe, Atsushi Suzuki, Yuichi Motohashi, Junichiro Azami, Yasushi Tateshita, Tsutomu Haruta. 5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance. In 2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020. pages 106-108, IEEE, 2020. [doi]
@inproceedings{SakanoTNAHYYKMI20,
title = {5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance},
author = {Yorito Sakano and Takahiro Toyoshima and Ryosuke Nakamura and Tomohiko Asatsuma and Yuki Hattori and Takayuki Yamanaka and Ryoichi Yoshikawa and Naoki Kawazu and Tomohiro Matsuura and Takahiro Iinuma and Takahiro Toya and Tomohiko Watanabe and Atsushi Suzuki and Yuichi Motohashi and Junichiro Azami and Yasushi Tateshita and Tsutomu Haruta},
year = {2020},
doi = {10.1109/ISSCC19947.2020.9063095},
url = {https://doi.org/10.1109/ISSCC19947.2020.9063095},
researchr = {https://researchr.org/publication/SakanoTNAHYYKMI20},
cites = {0},
citedby = {0},
pages = {106-108},
booktitle = {2020 IEEE International Solid- State Circuits Conference, ISSCC 2020, San Francisco, CA, USA, February 16-20, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3205-1},
}