Masato Sakurai, Kiichi Niitsu, Naohiro Harigai, Daiki Hirabayashi, Daiki Oki, Takahiro J. Yamaguchi, Haruo Kobayashi. Analysis of jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 146-149, IEEE, 2011. [doi]
Abstract is missing.