An effective solution to thermal-aware test scheduling on network-on-chip using multiple clock rates - researchr publication

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Hassan A. Salamy, Haidar Harmanani. An effective solution to thermal-aware test scheduling on network-on-chip using multiple clock rates. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 530-533, IEEE, 2012. [doi]

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