Kamran Saleem, Sreenivaas S. Muthyala, Nur A. Touba. Compacting output responses containing unknowns using an embedded processor. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 155-160, IEEE, 2015. [doi]
Abstract is missing.