G. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, O. P. Forlenza, R. J. Frishmuth, R. Yaari, S. Michnowski, U. Baur. Structural and functional test of IBM System z10 chips. IBM Journal of Research and Development, 53(1):5, 2009. [doi]
Abstract is missing.