M. Saliva, F. Cacho, V. Huard, X. Federspiel, D. Angot, A. Benhassain, A. Bravaix, L. Anghel. Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 441-446, ACM, 2015. [doi]
@inproceedings{SalivaCHFABBA15,
title = {Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI},
author = {M. Saliva and F. Cacho and V. Huard and X. Federspiel and D. Angot and A. Benhassain and A. Bravaix and L. Anghel},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092430},
researchr = {https://researchr.org/publication/SalivaCHFABBA15},
cites = {0},
citedby = {0},
pages = {441-446},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}