M. Saliva, F. Cacho, V. Huard, X. Federspiel, D. Angot, A. Benhassain, A. Bravaix, L. Anghel. Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 441-446, ACM, 2015. [doi]
Abstract is missing.