Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling

Emre Salman, Eby G. Friedman, Radu M. Secareanu, Olin L. Hartin. Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling. IEEE Trans. VLSI Syst., 17(10):1559-1564, 2009. [doi]

Abstract

Abstract is missing.