Kewal K. Saluja. An enhancement of lssd to reduce test pattern generation effort and increase fault coverage. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 489-494, ACM/IEEE, 1982. [doi]
Abstract is missing.