Anwesh Kumar Samal, Sandeep Kumar, Atin Mukherjee. Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.