Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Ander Iriondo, Iker Lluvia, Gotzone Aizpurua. Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks. Sensors, 23(4):1861, February 2023. [doi]
Abstract is missing.