A low-jitter supply-regulated charge pump phase-locked loop with built-in test and calibration

Wimol San-Um, Masayoshi Tachibana. A low-jitter supply-regulated charge pump phase-locked loop with built-in test and calibration. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 1931-1934, IEEE, 2010. [doi]

Abstract

Abstract is missing.