Cesar A. Sánchez-Martínez, Paulo López-Meyer, Esdras Juárez-Hernández, Aaron Desiga-Orenday, Andrés Viveros-Wacher. High Speed Serial Links Risk Assessment in Industrial Post-Silicon Validation Exploiting Machine Learning Techniques. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.