Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction

Tom Sander, Sven Lange, Ulrich Hilleringmann, Volker Geneiß, Christian Hedayat, Harald Kuhn, Franz-Barthold Gockel. Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. In 22nd IEEE International Conference on Industrial Technology, ICIT 2021, Valencia, Spain, March 10-12, 2021. pages 864-868, IEEE, 2021. [doi]

Authors

Tom Sander

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Sven Lange

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Ulrich Hilleringmann

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Volker Geneiß

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Christian Hedayat

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Harald Kuhn

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Franz-Barthold Gockel

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