Tom Sander, Sven Lange, Ulrich Hilleringmann, Volker Geneiß, Christian Hedayat, Harald Kuhn, Franz-Barthold Gockel. Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. In 22nd IEEE International Conference on Industrial Technology, ICIT 2021, Valencia, Spain, March 10-12, 2021. pages 864-868, IEEE, 2021. [doi]
@inproceedings{SanderLHGHKG21,
title = {Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction},
author = {Tom Sander and Sven Lange and Ulrich Hilleringmann and Volker Geneiß and Christian Hedayat and Harald Kuhn and Franz-Barthold Gockel},
year = {2021},
doi = {10.1109/ICIT46573.2021.9453646},
url = {https://doi.org/10.1109/ICIT46573.2021.9453646},
researchr = {https://researchr.org/publication/SanderLHGHKG21},
cites = {0},
citedby = {0},
pages = {864-868},
booktitle = {22nd IEEE International Conference on Industrial Technology, ICIT 2021, Valencia, Spain, March 10-12, 2021},
publisher = {IEEE},
isbn = {978-1-7281-5730-6},
}