Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study

Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis 0001, Cristina Meinhardt. Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. In LATS. pages 1-6, 2021. [doi]

Abstract

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