Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier

Vivek Sangwan, Cher Ming Tan, Dipesh Kapoor, Hsien-Chin Chiu. Electromagnetic Induced Failure in GaN-HEMT High-Frequency Power Amplifier. IEEE Transactions on Industrial Electronics, 67(7):5708-5716, 2020. [doi]

Abstract

Abstract is missing.