On-chip dynamic worst-case crosstalk pattern detection and elimination for bus-based macro-cell designs

Hariharan Sankaran, Srinivas Katkoori. On-chip dynamic worst-case crosstalk pattern detection and elimination for bus-based macro-cell designs. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 33-39, IEEE, 2009. [doi]

Authors

Hariharan Sankaran

This author has not been identified. Look up 'Hariharan Sankaran' in Google

Srinivas Katkoori

This author has not been identified. Look up 'Srinivas Katkoori' in Google