Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez 0002, Rafael Castro-López, Elisenda Roca, Hussam Amrouch. Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.