Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology

Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch. Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. In 25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020. pages 68-73, IEEE, 2020. [doi]

Abstract

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