Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes - researchr publication authors

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Carlo De Santi, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes. Microelectronics Reliability, 64:623-626, 2016. [doi]

This author has not been identified. Look up 'Carlo De Santi' in GoogleThis author has not been identified. Look up 'Matteo Meneghini' in GoogleThis author has not been identified. Look up 'Gaudenzio Meneghesso' in GoogleThis author has not been identified. Look up 'Enrico Zanoni' in Google

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