Carlo De Santi, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes. Microelectronics Reliability, 64:623-626, 2016. [doi]
@article{SantiMMZ16,
title = {Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes},
author = {Carlo De Santi and Matteo Meneghini and Gaudenzio Meneghesso and Enrico Zanoni},
year = {2016},
doi = {10.1016/j.microrel.2016.07.118},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.118},
researchr = {https://researchr.org/publication/SantiMMZ16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {623-626},
}