Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira. Defect-oriented testing of analogue and mixed signal ICs. In 5th IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998, Surfing the Waves of Science and Technology, Lisbon, Portugal, September 7-10, 1998 . pages 419-424, IEEE, 1998. [doi]
@inproceedings{SantosGOT98,
title = {Defect-oriented testing of analogue and mixed signal ICs},
author = {Marcelino B. Santos and Fernando M. Gonçalves and Michael J. Ohletz and João Paulo Teixeira},
year = {1998},
doi = {10.1109/ICECS.1998.814913},
url = {https://doi.org/10.1109/ICECS.1998.814913},
researchr = {https://researchr.org/publication/SantosGOT98},
cites = {0},
citedby = {0},
pages = {419-424},
booktitle = {5th IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998, Surfing the Waves of Science and Technology, Lisbon, Portugal, September 7-10, 1998 },
publisher = {IEEE},
isbn = {0-7803-5008-1},
}